Thank you to our Host:
We are excited to introduce a wider scope of our Quality and Reliability network that will now include, not only chip level, but also the electronic system level concerns for reliability. The event will provide insight on how companies across various sectors and tiers are approaching this challenge and how this will help deal with increasingly complex system technology qualification.
Talks will include a scene setting introduction from Martin Shaw, Reliability Solutions, followed by a focus on how standards are developing and input from multiple sector experiences, including manufacturing.
09:30 Welcome & Introduction – Martin Shaw, Reliability Solutions
09:40 Welcome from APC – Dan Bunting, Advanced Propulsion Centre UK
09:55 Introduction to Electronic System Reliability – Martin Shaw, Reliability Solutions
11:15 Consumer Electronics – From Chip to System – Kees Revenberg, MASER Engineering
11:45 Introduction to the Centre for Power Electronics – Helena Cartwright, University of Nottingham
12:15 Summary of Morning Session – Plans for Breakout
13:45 Reliability Considerations for Compound Semiconductor Applications – Alastair McGibbon, CSA Catapult
14:15 Reliability of Automotive traction Semiconductors – Dr Layi Alatise, University of Warwick
15:35 Summary and Final Q&A – Martin Shaw, Reliability Solutions
16:00 Event Close
Thank you to our Event Partners and Exhibitors: